Gallery 3D EBSD images of Dr. Zaefferer's Max-Planck group
The activity of the group has two main missions. The first one is the development and optimization of new hardware techniques in conjunction with softwaretools for advanced microstructure characterization in TEM, SEM, and FIB-SEM instruments. Specific focus is placed on diffraction methods such asorientation microscopy in the SEM and TEM, electron channelling contrast imaging (ECCI), internal stress determination via SEM/EBSD, high resolution electron back scatter diffraction (HR EBSD), and 3D electron back scatter diffraction (3DEBSD, tomographic EBSD).